MIcroelectronics RELiability driven by Artificial Intelligence

The European microelectronics (ME) industry has a direct impact on approximately 20% of the European GDP and employs over 250,000 people, with more than 64,000 job vacancies. The main technological challenges are 1) to increase both the reliability of the manufactured electronic components and systems (ECS) and sustainability to meet the requirements of the new EU directive Right to Repair, and 2) to reduce the huge product verification effort (70% of total product development time) that represents a substantial burden on costs and resources. To compete with China and North America, the European ME industry is in critical need of cross-discipline experts in electronic manufacturing and digital innovations: software, data and artificial intelligence.

The main goal of the MIRELAI industrial doctorate programme is to train the next generation of engineers and scientists for the next generation of reliable and repairable ECS developed within a trustworthy European value chain. The scientific approach is based on three pillars: 1) physics of degradation, 2) multi-scale modeling and 3) AI-based reliability which in sum will add up to a reinvention and new level of efficiency for the ‘design for repair and reliability’ for ECS.

Our unique industry-academia partnership of 8 industries, 4 SMEs and 9 research organisations and academic institutions from 7 European countries has all the expertise, experience and capacity along the electronics system value chain to deliver this ambitious research and training programme. Shared hosting and joint supervision by industry and academia of each of the 13 doctoral candidates ensures optimal knowledge transfer. Together, we will pave the way for sustainable, repairable and energy efficient electronic system designs and resource-friendly smart electronics applications. MIRELAI is thus perfectly aligned with the European research agenda and the EU Pact for Skills, a shared engagement model for skills development in Europe.